DocumentCode :
1215785
Title :
A Theoretical and Experimental Investigation of Tuned-Circuit Distortion in Frequency-Modulation Systems
Author :
Jaffe, David Lawrence
Author_Institution :
Templetone Radio Manufacturing Corporation, New London, Conn.
Volume :
33
Issue :
5
fYear :
1945
fDate :
5/1/1945 12:00:00 AM
Firstpage :
318
Lastpage :
333
Abstract :
The problem of distortion introduced into the modulation intelligence by tuned circuits is considered both theoretically and experimentally. Complex equations result when the effect of the intelligence modulation is considered. These equations, while not readily amenable to Fourier analysis, disclose that the distortion parameters are ΔW/BW and λ/BW where, ΔW/2π = peak-frequency swing λ/2π = modulation frequency BW = bandwidth in kilocycles measured at 3 decibels down. Double-tuned circuits critically coupled. If the effect of the modulation frequency is neglected, the equations resulting from a theoretical analysis are somewhat simplified and the distortion due to single- and double-tuned circuits can be formulated. Close agreement between calculated and measured distortion was obtained up to approximately a 5000-cycle-per-second modulation frequency. At this frequency the departure of the observed from calculated values was quite noticeable. Theoretical maximum-distortion limits for the single- and double-tuned circuits are derived. For the single-tuned circuit the theoretical maximum distortion is Dnmax (single-tuned circuit) = 2λ/ΔW·100. For the double-tuned circuit it is Dnmax (double-tuned circuit) = 4λ/ΔW·100 A conservative design figure relating bandwidth to frequency swing in order to insure distortion-free transmission to 15,000 cycles per second was experimentally found to be, ΔW/BW = 1/4.
Keywords :
Amplitude modulation; Circuit noise; Circuit theory; Distortion measurement; Equations; Frequency measurement; Frequency modulation; RLC circuits; Radio transmitters; Signal to noise ratio;
fLanguage :
English
Journal_Title :
Proceedings of the IRE
Publisher :
ieee
ISSN :
0096-8390
Type :
jour
DOI :
10.1109/JRPROC.1945.234544
Filename :
1696847
Link To Document :
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