• DocumentCode
    1215906
  • Title

    Single event effects in analog-to-digital converters: device performance and system impact

  • Author

    Turflinger, T.L. ; Davey, M.V. ; Mappes, B.M.

  • Author_Institution
    Crane Div., Naval Surface Warfare Centre, Crane, IN, USA
  • Volume
    41
  • Issue
    6
  • fYear
    1994
  • Firstpage
    2187
  • Lastpage
    2194
  • Abstract
    Monolithic analog-to-digital converters (ADCs) exhibit a large error rate in the single event effects (SEE) environment. Analysis of data from a high-performance ADC demonstrates the type of errors and their potential impact on system performance.<>
  • Keywords
    analogue-digital conversion; coding errors; error statistics; monolithic integrated circuits; radiation effects; A/D convertors; analog-to-digital converters; error rate; monolithic ADCs; single event effects; Aerospace testing; Analog-digital conversion; Cranes; Data analysis; Degradation; Error analysis; Particle beams; Protons; System performance; Voltage;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.340561
  • Filename
    340561
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1215906