Title :
Single event effects in analog-to-digital converters: device performance and system impact
Author :
Turflinger, T.L. ; Davey, M.V. ; Mappes, B.M.
Author_Institution :
Crane Div., Naval Surface Warfare Centre, Crane, IN, USA
Abstract :
Monolithic analog-to-digital converters (ADCs) exhibit a large error rate in the single event effects (SEE) environment. Analysis of data from a high-performance ADC demonstrates the type of errors and their potential impact on system performance.<>
Keywords :
analogue-digital conversion; coding errors; error statistics; monolithic integrated circuits; radiation effects; A/D convertors; analog-to-digital converters; error rate; monolithic ADCs; single event effects; Aerospace testing; Analog-digital conversion; Cranes; Data analysis; Degradation; Error analysis; Particle beams; Protons; System performance; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
