DocumentCode :
1215927
Title :
Microstructural and Magnetic Characterization of {\\hbox {CuNb}}/{\\hbox {Nb}}_{3}{\\hbox {Sn}} Wires With Different Architectures
Author :
Sandim, Maria J R ; Cangani, Maxwell P. ; Sandim, Hugo R Z ; Ghivelder, Luis ; Awaji, Satoshi ; Badica, Petre ; Watanabe, Kazuo
Author_Institution :
Escola de Eng. de Lorena-USP, Lorena
Volume :
18
Issue :
2
fYear :
2008
fDate :
6/1/2008 12:00:00 AM
Firstpage :
1022
Lastpage :
1025
Abstract :
In this work we focus on the microstructural and magnetic characterization of wires with different architectures (design and reinforcement). The microstructural characterization was performed using scanning electron microscopy. AC magnetic susceptibility was measured with field applied both parallel and perpendicular to the wire axis. The heat treatment performed to form the A-15 superconducting phase leads to partial spheroidization followed by coarsening of the Nb filaments in the reinforcement material. The differences concerning the microstructure of the reinforcement material among the investigated wires were reflected in the broadening of the superconducting transition of Nb, more evident for a field applied parallel to the wire axis. From the magnetic data the wires were also compared in terms of the superconducting volume fraction.
Keywords :
copper alloys; magnetic susceptibility; niobium alloys; scanning electron microscopy; spheroidizing; superconducting materials; superconducting transitions; tin alloys; wires; A-15 superconducting phase lead; AC magnetic susceptibility; CuNb-Nb3Sn; magnetic characterization; microstructural characterization; scanning electron microscopy; spheroidization; superconducting transition; superconducting wires; ${hbox{CuNb}}/{hbox{Nb}}_{3}{hbox{Sn}}$ superconducting wires; magnetic properties; microstructure; spheroidization;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2008.920575
Filename :
4517332
Link To Document :
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