• DocumentCode
    1216177
  • Title

    The single event upset environment for avionics at high latitude

  • Author

    Sims, A.J. ; Dyer, C.S. ; Peerless, C.L. ; Johansson, K. ; Pettersson, H. ; Farren, J.

  • Author_Institution
    Dept. of Space & Commun., Defence Res. Agency, Farnborough,, UK
  • Volume
    41
  • Issue
    6
  • fYear
    1994
  • Firstpage
    2361
  • Lastpage
    2367
  • Abstract
    Measurements of the high latitude SEU environment at avionics altitude have been made on board a commercial airliner. Results are compared with models of primary and secondary cosmic rays and atmospheric neutrons. Ground based SEU tests of static RAMs are used to predict rates in flight.<>
  • Keywords
    SRAM chips; aircraft instrumentation; avionics; cosmic ray interactions; environmental testing; neutron effects; SEU environment; atmospheric neutrons; avionics; commercial airliner; cosmic rays; high latitude; single event upset environment; static RAMs; Aerospace electronics; Atmospheric measurements; Atmospheric modeling; Cosmic rays; Detectors; Energy measurement; Instruments; Neutrons; Single event upset; Space technology;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.340588
  • Filename
    340588
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1216177