Applying new solar particle event models to interplanetary satellite programs

Variability in the models and methods used for single event upset (SEU) calculations in microelectronic memory devices can lead to a range of possible upset rates. In order to compare the Adams 1986 interplanetary solar flare model to a new model proposed by scientists at the Jet Propulsion Laboratory (JPL92) the authors have calculated an array of upset rates using heavy ion and proton data for selected DRAM and SRAM memories and for Actel Field Programmable Gate Arrays (FPGAs). To make more general comparisons of the models the authors have produced a set of engineering curves of predicted upset rates versus hypothetical device cross-section parameters. The results show that use of this more realistic, although still conservative, JPL model can have significant benefits for satellite programs, especially those which must operate continuously during solar particle events. The benefits include more flexibility in model choice, a higher level of confidence in the environment, and potential cost savings by the calculation of less pessimistic SEU rates which allow designers to integrate commercial products into their spacecraft design with the use of Error Detection and Correction (EDAC) schemes.<>