Title :
Model-based, multiple-fault diagnosis of dynamic, continuous physical devices
Author_Institution :
Texas Univ., Austin, TX, USA
Abstract :
A diagnosis algorithm called Inc-Diagnose that can generate diagnosis candidates incrementally and detect multiple faults is presented. It models continuously changing device states using a discrete set of Qsim qualitative states over time. Inc-Diagnose is a modification of R. Reiter´s algorithm (Artif. Intell., vol.32., no.1, p.57-95, 1987), the theory of which is reviewed. An example diagnosis is given.<>
Keywords :
artificial intelligence; automatic testing; failure analysis; Inc-Diagnose; Qsim qualitative states; continuously changing device states; diagnosis algorithm; diagnosis candidates; multiple-fault diagnosis; physical devices; Circuit faults; Digital circuits; Discrete transforms; Fault detection; Fault diagnosis; Logic devices; Logic testing; Nose; Predictive models; Robustness;
Journal_Title :
IEEE Expert
