Title :
Total dose correlation of 4007 devices flown on the CRRES MEP experiment
Author :
Zimmerman, D.M. ; Ray, K.P.
Author_Institution :
S-Cubed Div., Maxwell Lab., San Diego, CA, USA
Abstract :
This paper considers total dose measurements of six 4007 type devices in the Microelectronics Package (MEP) on board the Combined Release and Radiation Effects Satellite (CRRES). The on-orbit device performance of the 4007 devices is compared to /sup 60/Co ground test data from identical devices. The results show that the low dose rate space data and the higher dose rate /sup 60/Co data agree within a factor of 2.5 for all six 4007 device types.<>
Keywords :
CMOS logic circuits; integrated circuit measurement; integrated circuit testing; logic testing; radiation effects; /sup 60/Co ground test; 4007 devices; CRRES MEP experiment; Co; Combined Release/Radiation Effects Satellite; digital ICs; low dose rate space data; microelectronics package; on-orbit device performance; total dose correlation; total dose measurements; Extraterrestrial measurements; Laboratories; Microelectronics; NASA; Orbits; PROM; Packaging; Satellites; Testing; Threshold voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
