DocumentCode
121687
Title
Spray pyrolysis coating Al2 O3 :Cl/TiO2 bilayer for PERC
Author
Hsing-Hua Wu ; Kuei-Bo Chen ; Huang, Walt K. W. ; Nai-Tien Ou ; Chung-Han Wu ; Sheng-Min Yu ; Wan-Ying Chou ; Sung-Yen Wei ; Tai-Jui Wang ; Wen-Ching Sun
Author_Institution
Gintech Energy Corp., Miaoli, Taiwan
fYear
2014
fDate
8-13 June 2014
Firstpage
1265
Lastpage
1267
Abstract
In this study we use low-cost spray pyrolysis method to produce a Al2O3:Cl/TiO2 bilayer as rear passivation layer to replace the common known Al2O3/SiNx laminate in PERC structure silicon solar cells. The TiO2 and TiO2/Al2O3 mixed thin film acts a competent barrier from molten aluminum paste during the co-firing process and high refractive index of those thin films demonstrated excellent internal back reflectance (IBR). Very high negative fixed charge concentration is up to 5 × 1012 cm-2 in TiO2 thin film being observed and the interface trap density (Dit) can be controlled via Ti/Al ratio and ultra-thin Al2O3:Cl interfacial layer to maintain good passivation ability and the lowest result of Dit is 8 × 1010 cm-2eV-1 with a 6nm Al2O3:Cl interfacial layer. Through the use of Al2O3:Cl interfacial layer, the carrier lifetime of bulk wafer increase from 60μs to 120μs. All of the results show that this concept is very promising for high efficiency silicon solar cell application.
Keywords
aluminium compounds; firing (materials); laminates; passivation; pyrolysis; refractive index; semiconductor thin films; solar cells; sprays; titanium compounds; Al2O3:Cl-TiO2; PERC; PERC structure silicon solar cells; bulk wafer; co-firing process; interface trap density; interfacial layer; internal back reflectance; molten aluminum paste; passivation; rear passivation layer; refractive index; silicon solar cell; thin film; Aluminum; Capacitance-voltage characteristics; Films; Passivation; Photovoltaic cells; Silicon; PERC; passivation; spray pyrolysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
Conference_Location
Denver, CO
Type
conf
DOI
10.1109/PVSC.2014.6925145
Filename
6925145
Link To Document