• DocumentCode
    1216973
  • Title

    E-Nose Vapor Identification Based on Dempster–Shafer Fusion of Multiple Classifiers

  • Author

    Li, Winston ; Leung, Henry ; Kwan, Chiman ; Linnell, Bruce R.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Calgary, Calgary, AB
  • Volume
    57
  • Issue
    10
  • fYear
    2008
  • Firstpage
    2273
  • Lastpage
    2282
  • Abstract
    Electronic noses (e-noses) are commonly used to monitor air contaminants in space stations and shuttles. Data preprocessing (measurement denoising and feature extraction) and pattern classification are important problems of an e-nose system. In this paper, the application of a wavelet-based denoising method and a Dempster-Shafer (DS) classification fusion method in an e-nose system are proposed. Six transient-state features are extracted from the sensor measurements filtered by the wavelet denoising method and are used to train multiple classifiers such as multilayer perceptrons (MLPs), support vector machines (SVMs), k -nearest neighbors (KNNs), and the Parzen classifier. The DS technique is used at the end to fuse the results of the multiple classifiers to get the final classification. Experimental analysis based on real vapor data shows that the wavelet denoising method can successfully remove both random noise and outliers, and the classification rate can be improved by using classifier fusion.
  • Keywords
    aerospace biophysics; air pollution measurement; contamination; electronic noses; feature extraction; inference mechanisms; multilayer perceptrons; occupational health; occupational safety; pattern classification; random noise; sensor fusion; signal classification; signal denoising; support vector machines; Dempster-Shafer classification fusion method; E-nose vapor identification; Parzen classifier; air contaminants monitoring; astronauts health-and-safety; data preprocessing; electronic noses; gas sensor arrays; gas sensor signals; k -nearest neighbors; measurement denoising; multilayer perceptrons; multiple classifiers; pattern classification; random noise; shuttles; space stations; support vector machines; transient-state feature extraction; wavelet-based denoising method; $k$-nearest neighbor (KNN); $k$-nearest neighbor (KNN); Dempster–Shafer (DS); Dempster??Shafer (DS); Parzen classifier; electronic nose (e-nose); neural network (NN); support vector machine (SVM); wavelet denoising;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2008.922092
  • Filename
    4518965