Title :
Multiport VNA measurement
Author :
Ruttan, Thomas G. ; Grossman, Brett ; Ferrero, Andrea ; Teppati, Valeria ; Martens, Jon
Author_Institution :
Intel Corp., Santa Clara, CA
fDate :
6/1/2008 12:00:00 AM
Abstract :
This article presents some of the most recent multiport VNA measurement methodologies used to characterize these high-speed digital networks for signal integrity. There will be a discussion of the trends and measurement challenges of high-speed digital systems, followed by a presentation of the multiport VNA measurement system details, calibration, and measurement techniques, as well as some examples of interconnect device measurements. The intent here is to present some general concepts and trends for multiport VNA measurements as applied to computer system board-level interconnect structures, and not to promote any particular brand or product.
Keywords :
calibration; microwave measurement; multiport networks; network analysers; calibration; high-speed digital networks; mltiport VNA measurement; signal integrity; Bandwidth; CMOS technology; Clocks; Digital systems; Frequency measurement; Microcomputers; Microwave measurements; Packaging; Pins; Signal design;
Journal_Title :
Microwave Magazine, IEEE
DOI :
10.1109/MMM.2008.919919