DocumentCode
121750
Title
Relative efficiency revealed: Equations for k1 –k6 of the PVGIS model
Author
Yordanov, Georgi Hristov
Author_Institution
Univ. of Agder (UiA), Grimstad, Norway
fYear
2014
fDate
8-13 June 2014
Firstpage
1393
Lastpage
1398
Abstract
The European PV Geographical Information System (PVGIS) describes module performance in terms of the relative efficiency with respect to Standard Testing Conditions (STC). The efficiency´s dependence on irradiance and operating temperature is modeled with a bi-quadratic polynomial with respect to the relative temperature and the logarithm of relative irradiance. In earlier works, the present author derived relations between two model coefficients describing the irradiance dependence at 25°C, k1 and k2, and I-V curve model parameters such as the series resistance RS and the ideality factor n. There was good agreement between the theoretical and fitted values of k1, but the fitted values of k2 were overestimated for most of the studied crystalline-silicon (c-Si) modules. The present paper derives a correction factor for k2 and equations for k3 - k6. The results are limited to the case of PV modules behaving well according to the one-exponential I-V curve model, with negligible current leakage via cell shunts. The effects of several I-V curve non-idealities on performance are discussed.
Keywords
elemental semiconductors; geographic information systems; power engineering computing; silicon; solar cells; European PV geographical information system; I-V curve model; PV modules; PVGIS model; Si; cell shunts; crystalline-silicon modules; current leakage; irradiance dependence; leakage; one-exponential I-V curve model; series resistance; standard testing conditions; temperature 25 C; Aging; Computer architecture; Equations; Mathematical model; Meteorology; Microprocessors; Sun; I–V curve model; PV modules; PVGIS; energy rating; performance model; relative efficiency;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
Conference_Location
Denver, CO
Type
conf
DOI
10.1109/PVSC.2014.6925178
Filename
6925178
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