DocumentCode :
1217540
Title :
Modeling and characterization of RF and microwave power FETs [book review]
Author :
Riddle, Alfy
Volume :
9
Issue :
3
fYear :
2008
fDate :
6/1/2008 12:00:00 AM
Firstpage :
154
Lastpage :
156
Abstract :
This book provides a coherent review of the advanced state of power FET modeling and characterization. It covers the topics of device construction, model selection, device measurement, and model validation in sufficient detail to be truly useful. Although not designed as a university text, the book contains enough math and fundamental to serve as a foundation for a course. This is a well-written and useful text.
Keywords :
Book reviews; Electromagnetic compatibility; Electromagnetic fields; Electromagnetic scattering; Electromagnetic waveguides; FETs; Impedance; Microwave devices; Power engineering and energy; Radio frequency;
fLanguage :
English
Journal_Title :
Microwave Magazine, IEEE
Publisher :
ieee
ISSN :
1527-3342
Type :
jour
DOI :
10.1109/MMM.2008.919961
Filename :
4519516
Link To Document :
بازگشت