Title :
An 8 ns 256 K BiCMOS RAM
Author :
Tamba, Nobuo ; Miyaoka, Shuuichi ; Odaka, Masanori ; Ogiue, Katsumi ; Yamada, Kouichirou ; Ikeda, Takahide ; Hirao, Mitsuru ; Higuchi, Hisayuki ; Uchida, Hideaki
Author_Institution :
Dept. of Electr. Eng., Stanford Univ., CA, USA
fDate :
8/1/1989 12:00:00 AM
Abstract :
A 256 K word×1 bit emitter-coupled logic (ECL) RAM, which achieves an 8 ns address access time, less than 400 mW power consumption at 50 MHz operation, and 150 mW at standby mode, is presented. To achieve an address access time of less than 10 nss and high packing density, an advanced 1.0 μm high-performance bipolar CMOS (Hi-BiCMOS) technology is used. A 9 GHz bipolar transistor cutoff frequency, 0.26 ns ECL gate propagation delay time, and 0.35 ns BiCMOS gate have been obtained. A 1.0 μm design rule permits layout of an NMOS memory cell with a high-resistance polysilicon load in 54.7 μm2 and a 4.09×8.60 mm2 chip. High performance is achieved by an optimized circuit design using a new input buffer, a BiCMOS decoder, and a high-speed bipolar sense amplifier. An active pull-down emitter-follower circuit and a BiCMOS current mirror ECL-MOS level shift circuit improve input buffer delay to less than 1.8 ns. A power-down technique has been studied to reduce standby power. Some experimental results are presented. High-speed address access is observed over a wide operational range
Keywords :
BIMOS integrated circuits; VLSI; emitter-coupled logic; integrated memory circuits; random-access storage; 1.0 micron; 150 mW; 256 kbit; 8 ns; NMOS memory cell; active pull-down emitter-follower circuit; address access time; cutoff frequency; emitter-coupled logic; gate propagation delay time; high-resistance polysilicon load; high-speed bipolar sense amplifier; input buffer; input buffer delay; packing density; power consumption; power-down technique; standby mode; BiCMOS integrated circuits; Bipolar transistors; CMOS logic circuits; CMOS technology; Cutoff frequency; Design optimization; Energy consumption; MOS devices; Propagation delay; Read-write memory;
Journal_Title :
Solid-State Circuits, IEEE Journal of