DocumentCode
121768
Title
Calculating material criticality of transparent conductive electrodes used for thin film and third generation solar cells
Author
Jarrett, Ross ; Dawson, Daniel ; Roelich, Katy ; Purnell, Phillip
Author_Institution
Energy Res. Inst., Univ. of Leeds, Leeds, UK
fYear
2014
fDate
8-13 June 2014
Firstpage
1436
Lastpage
1441
Abstract
The supply risk and exposure to supply shortage is becoming an important factor in the consideration of a mass low carbon technology roll-out. This study takes current criticality studies, which analyse the criticality of single raw materials, and extends it to calculate the relative criticality of multiple material transparent conductive electrodes (TCE). It compares the calculated criticality with the TCE´s Haacke figure of merit. It is found that more recent TCEs developed to replace the commonly used indium tin oxide, such as flurine doped tin oxide and silver nanowires, can have a higher criticality, even though the materials themselves are currently less expensive.
Keywords
electrodes; raw materials; semiconductor thin films; solar cells; flurine doped tin oxide; indium tin oxide; mass low carbon technology roll-out; material criticality; materials; raw materials; silver nanowires; supply risk; thin film; third generation solar cells; transparent conductive electrodes; Indium tin oxide; Photovoltaic cells; Production; Raw materials; Silver; Tin; criticality; silver nanowire; supply risk; thin film; transparent conductive electrode;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
Conference_Location
Denver, CO
Type
conf
DOI
10.1109/PVSC.2014.6925186
Filename
6925186
Link To Document