• DocumentCode
    121768
  • Title

    Calculating material criticality of transparent conductive electrodes used for thin film and third generation solar cells

  • Author

    Jarrett, Ross ; Dawson, Daniel ; Roelich, Katy ; Purnell, Phillip

  • Author_Institution
    Energy Res. Inst., Univ. of Leeds, Leeds, UK
  • fYear
    2014
  • fDate
    8-13 June 2014
  • Firstpage
    1436
  • Lastpage
    1441
  • Abstract
    The supply risk and exposure to supply shortage is becoming an important factor in the consideration of a mass low carbon technology roll-out. This study takes current criticality studies, which analyse the criticality of single raw materials, and extends it to calculate the relative criticality of multiple material transparent conductive electrodes (TCE). It compares the calculated criticality with the TCE´s Haacke figure of merit. It is found that more recent TCEs developed to replace the commonly used indium tin oxide, such as flurine doped tin oxide and silver nanowires, can have a higher criticality, even though the materials themselves are currently less expensive.
  • Keywords
    electrodes; raw materials; semiconductor thin films; solar cells; flurine doped tin oxide; indium tin oxide; mass low carbon technology roll-out; material criticality; materials; raw materials; silver nanowires; supply risk; thin film; third generation solar cells; transparent conductive electrodes; Indium tin oxide; Photovoltaic cells; Production; Raw materials; Silver; Tin; criticality; silver nanowire; supply risk; thin film; transparent conductive electrode;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
  • Conference_Location
    Denver, CO
  • Type

    conf

  • DOI
    10.1109/PVSC.2014.6925186
  • Filename
    6925186