DocumentCode :
1217856
Title :
Studies in VLSI technology economics. IV. Models for gate array design productivity
Author :
Fey, Curt F. ; Paraskevopoulos, Demetris E.
Author_Institution :
Xerox Corp., Webster, NY, USA
Volume :
24
Issue :
4
fYear :
1989
fDate :
8/1/1989 12:00:00 AM
Firstpage :
1085
Lastpage :
1091
Abstract :
An empirical model of design productivity is presented and its implications for current and future design are discussed. Model and observed values correlate well (the correlation coefficient is 0.85). The analysis encompasses 70 designs, primarily gate arrays, of up to 25000 gates from five major corporations, designed during 1983-8. The estimate of design productivity enables the determination of normalized productivity, manpower, and schedule. The normalized design productivity adjusts for differences in the design tasks, permitting standardized productivity measurements for planning and for benchmarking
Keywords :
VLSI; economics; logic arrays; logic design; VLSI technology economics; benchmarking; correlation coefficient; design productivity; empirical model; gate array design productivity; manpower; normalized productivity; standardized productivity measurements; Circuit testing; Costs; Fabrication; Microelectronics; Monitoring; National electric code; Power generation economics; Productivity; Scheduling; Very large scale integration;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.34096
Filename :
34096
Link To Document :
بازگشت