Title :
Representation of the solar capacity value in the ReEDS capacity expansion model
Author :
Sigrin, Ben ; Sullivan, Patrick ; Ibanez, Eduardo ; Margolis, Robert
Author_Institution :
Nat. Renewable Energy Lab., Golden, CO, USA
Abstract :
An important emerging issue is the estimation of renewables´ contributions to reliably meeting system demand, or their capacity value. While the capacity value of thermal generation can be estimated easily, assessment of wind and solar requires a more nuanced approach due to resource variability. Reliability-based methods, particularly, effective load-carrying capacity (ELCC), are considered to be the most robust techniques for addressing this resource variability. The Regional Energy Deployment System (ReEDS) capacity expansion model and other long-term electricity capacity planning models require an approach to estimating CV for generalized PV and system configurations with low computational and data requirements. In this paper we validate treatment of solar photovoltaic (PV) capacity value by ReEDS capacity expansion model by comparing model results to literature for a range of energy penetration levels. Results from the ReEDS model are found to compare well with both comparisons-despite not being resolved at an hourly scale.
Keywords :
photovoltaic power systems; power generation planning; power generation reliability; solar power stations; ELCC; ReEDS capacity expansion model; effective load-carrying capacity; energy penetration levels; generalized PV configurations; long-term electricity capacity planning models; regional energy deployment system; reliability-based methods; solar assessment; solar capacity value representation; solar photovoltaic capacity value; system configurations; thermal generation; wind assessment; Barium; Capacity planning; Computational modeling; Load modeling; Planning; Power system reliability; Reliability; power system reliability; power system simulation; solar energy; solar power generation;
Conference_Titel :
Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
Conference_Location :
Denver, CO
DOI :
10.1109/PVSC.2014.6925195