DocumentCode
1217922
Title
Development of an S-band 50-kW-Average-Power Klystron
Author
Zhang, Zhaochuan ; Ding, Yaogen ; Fan, Junjie ; Guo, Yanfang ; Zhang, Yuwen ; Shen, Bin ; Fu, Chunjiu ; Fan, Xudong
Author_Institution
Inst. of Electron., Chinese Acad. of Sci., Beijing
Volume
56
Issue
5
fYear
2009
fDate
5/1/2009 12:00:00 AM
Firstpage
891
Lastpage
895
Abstract
This paper reports the design considerations, simulation results, and test results of an S-band 70-MHz-instantaneous-bandwidth 50-kW-average-power klystron, which was developed by the Institute of Electronics, Chinese Academy of Sciences, from January 2004 to August 2007. The typical result is a 50-kW average output power with an 89-mus RF pulsewidth and a 300-Hz repetition rate during 8 h of continuous reliability testing. A cracked output window is also discussed.
Keywords
cracks; electron device testing; klystrons; reliability; S-band; bandwidth 70 MHz; crack of alumina disk; frequency 300 Hz; klystrons; power 50 kW; reliability testing; time 8 h; Cathodes; Coils; Current density; Electronic equipment testing; Electrons; Klystrons; Magnetic fields; Radio frequency; Superconducting microwave devices; Thermal stresses; Crack of alumina disk; design considerations; klystron; simulation results; test results;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2009.2015417
Filename
4808161
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