• DocumentCode
    1218065
  • Title

    Josephson memory technology

  • Author

    Wada, Yoshifusa

  • Author_Institution
    NEC Corp., Kanagawa, Japan
  • Volume
    77
  • Issue
    8
  • fYear
    1989
  • fDate
    8/1/1989 12:00:00 AM
  • Firstpage
    1194
  • Lastpage
    1207
  • Abstract
    Memory circuit architecture (decoder, cell, cell array, and sense circuit) is surveyed, with emphasis on implementing a memory with fast access and low power consumption. Recent progress in fabrication and circuit technology has improved memory performance. An AC powering scheme, instead of the earlier DC system, has been developed. The AC powering scheme eliminates complicated timing control, which restricts shortening access time, but introduces large power consumption and in-phase powering problems. A parallel decoding scheme that decreases the number of decoding stages is presented. It will decrease the decoding time and AND scheme decoder. An attractive OR-inverter scheme has been proposed for a decoder suitable for a memory with a large capacity. The chip performance strongly depends not only on whether the read mode is destructive or nondestructive but also on the cell connection method, which determines the line inductance. Because the cell input line inductance depends on layered construction of the lines, a planarizing technology for an Nb Josephson integrated circuit has been developed to reduce line inductance by thinning the insulators. Access time of less than 0.5 ns has been confirmed in 1-kb and 4-kb memories using the proposed memory architecture
  • Keywords
    cellular arrays; decoding; reviews; superconducting memory circuits; 0.5 ns; 1 kbit; 4 kbit; AC powering scheme; AND scheme decoder; Josephson integrated circuit; Josephson memory technology; Nb; OR-inverter scheme; access time; cell array; cell connection method; decoding time; memory circuit architecture; parallel decoding scheme; planarizing technology; power consumption; sense circuit; Cache memory; Circuits; Decoding; Energy consumption; Fabrication; Inductance; Magnetic flux; Memory architecture; Niobium; Read-write memory;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/5.34119
  • Filename
    34119