DocumentCode
121835
Title
State based test case generation using VCL-GA
Author
Arora, Abhishek ; Sinha, Madhavi
Author_Institution
CSE / IT Dept., Jaypee Inst. of Inf. Technol., Noida, India
fYear
2014
fDate
7-8 Feb. 2014
Firstpage
661
Lastpage
665
Abstract
This paper presents a method for test cases generation from a state machine. This paper investigates variable chromosome length genetic algorithm for automatically generating state based test cases. For efficiency we developed a Genetic algorithm that optimize and select test case which are covering maximum number of states and transitions on distinct chromosome length. Variable chromosome Length Genetic algorithm was requisite because of throttle in representing FSM as a binary chromosome discussed in this research paper and various issues discussed in paper. In this paper, Genetic Algorithm starts with a short chromosome length and retrieves the best solution with respect to optimized test cases covering maximum states and maximum transition of chosen state machine. The best solutions are then moved to the next stage with longer chromosome length. In this paper population size is again varying on the basis of chromosome length. To validate the introduced technique, experiment with the test-data-generation technique has been applied on numerous state machines.
Keywords
finite state machines; genetic algorithms; optimising compilers; program testing; FSM; VCL-GA; optimized test cases; state based test case generation; state machine; test-data-generation technique; variable chromosome length genetic algorithm; Biological cells; Biotechnology; Education; Reliability; Sociology; Statistics; Genetic algorithm; State machine; variable chromosome length Genetic Algorithm;
fLanguage
English
Publisher
ieee
Conference_Titel
Issues and Challenges in Intelligent Computing Techniques (ICICT), 2014 International Conference on
Conference_Location
Ghaziabad
Type
conf
DOI
10.1109/ICICICT.2014.6781358
Filename
6781358
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