DocumentCode :
121851
Title :
Electron beam induced current in photovoltaics with high recombination
Author :
Haney, Paul ; Heayoung Yoon ; Zhitenev, Nikolai
Author_Institution :
Center for Nanoscale Sci. & Technol., Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fYear :
2014
fDate :
8-13 June 2014
Firstpage :
1616
Lastpage :
1620
Abstract :
A model for interpreting electron beam induced current (EBIC) measurements is presented, which applies when recombination within the depletion region is substantial. This model is motivated by cross-sectional EBIC experiments on CdS-CdTe photovoltaic cells (prepared by cleaving, or focused ion beam milling). The experimental results clearly show that the maximum efficiency of carrier collection is less than 100 % and varies throughout the depletion region, contrary to the assumptions of most models used to interpret EBIC data. We describe a model which relaxes these assumptions by including recombination in the depletion region. We find that our model can reproduce experimental results only if the mobility-lifetime product μτ is spatially varying within the depletion region.
Keywords :
EBIC; focused ion beam technology; solar cells; CdS-CdTe; carrier collection; cleaving; cross-sectional EBIC measurements; depletion region; electron beam induced current; focused ion beam milling; mobility-lifetime product; photovoltaic cells; Analytical models; Gold; Materials; CdTe; Electron beam induced current;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
Conference_Location :
Denver, CO
Type :
conf
DOI :
10.1109/PVSC.2014.6925229
Filename :
6925229
Link To Document :
بازگشت