• DocumentCode
    1218585
  • Title

    Filamentation and beam propagation in broad-area semiconductor lasers

  • Author

    Hess, Ortwin ; Koch, Stephan W. ; Moloney, Jerome V.

  • Author_Institution
    Dept. of Phys., Philipps-Univ., Marburg, Germany
  • Volume
    31
  • Issue
    1
  • fYear
    1995
  • fDate
    1/1/1995 12:00:00 AM
  • Firstpage
    35
  • Lastpage
    43
  • Abstract
    The spatio-temporal dynamics of broad-area semiconductor lasers is studied theoretically by numerically solving space-dependent coupled partial differential equations for the (complex) optical fields, the interband polarization and the density of charge carriers. The formation and longitudinal propagation of unstable transverse optical filamentary structures is analyzed in a model configuration for typical double-heterostructure broad-area lasers. Spectral and spatial holeburning in the carrier distributions is observed as a consequence of selective density depletion by the transverse laser modes. The transverse holeburning leads to complex spatio-temporal patterns
  • Keywords
    filamentation instability; laser modes; laser stability; laser theory; light polarisation; nonlinear optics; optical hole burning; partial differential equations; semiconductor lasers; beam propagation; broad-area semiconductor lasers; carrier distributions; charge carrier density; complex optical fields; complex spatio-temporal patterns; filamentation; interband polarization; longitudinal propagation; model configuration; selective density depletion; space-dependent coupled partial differential equations; spatial holeburning; spatio-temporal dynamics; spectral holeburning; transverse holeburning; transverse laser modes; typical double-heterostructure broad-area lasers; unstable transverse optical filamentary structures; Charge carriers; Laser beams; Laser modes; Laser theory; Nonlinear optics; Optical microscopy; Optical polarization; Optical propagation; Physics; Semiconductor lasers;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.341705
  • Filename
    341705