DocumentCode :
121860
Title :
Effect of varying process parameters on CdTe thin film device performance and its relationship to film microstructure
Author :
Munshi, Amit ; Abbas, Asad ; Raguse, John ; Barth, Kurt ; Sampath, W.S. ; Walls, Jeffrey M.
Author_Institution :
Colorado State Univ., Fort Collins, CO, USA
fYear :
2014
fDate :
8-13 June 2014
Firstpage :
1643
Lastpage :
1648
Abstract :
The performance of CdTe thin film photovoltaic devices are sensitive to process parameters. In this study, efforts are made to further understand the effects of process parameters like process temperature and variation in cadmium chloride passivation treatment on CdTe films deposited using a sublimation based deposition system. The effects on film microstructure are studied using advanced microstructural characterization methods like TEM, SEM, EDS and SIMS while electrical performance is studied using various electrical measurements such as current density vs. voltage and electroluminescence. The aim of this study is to provide new insight into the understanding of relationship between fabrication process, device performance and thin film microstructure.
Keywords :
cadmium compounds; microfabrication; passivation; photovoltaic cells; semiconductor thin films; sublimation; tellurium compounds; thin film devices; EDS; SEM; SIMS; TEM; advanced microstructural characterization method; cadmium chloride passivation treatment; cadmium telluride thin film photovoltaic device performance; electrical measurements; fabrication process; film microstructure; photovoltaic cells; process temperature; sublimation based deposition system; varying process parameters; Films; Passivation; Performance evaluation; Stacking; Standards; Substrates; Temperature; Cadmium; Photovoltaic Cells; Solar Energy; Tellurium; Thin Film;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
Conference_Location :
Denver, CO
Type :
conf
DOI :
10.1109/PVSC.2014.6925235
Filename :
6925235
Link To Document :
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