• DocumentCode
    1218652
  • Title

    Electric-field-induced refractive index changes in InGaAs-InAlAs asymmetric coupled quantum wells

  • Author

    Susa, Nobuhiko

  • Author_Institution
    NTT Opto-Electron. Labs., Atsugi, Japan
  • Volume
    31
  • Issue
    1
  • fYear
    1995
  • fDate
    1/1/1995 12:00:00 AM
  • Firstpage
    92
  • Lastpage
    100
  • Abstract
    Two kinds of InGaAs-InAlAs asymmetric coupled quantum wells (QW´s) were numerically analyzed in an effort to enhance change in the refractive index (Δn) at longer wavelengths where absorption coefficient is small. The analysis reveals the operating voltage, Δn, chirp parameter, Δn/Δk, (Δk: change in the extinction coefficient) and figure of merit, Δn/α, (α: absorption coefficient) can be improved by these two kinds of the QW´s. This improvement is caused by an abrupt electric-field-induced increase or decrease in the oscillator strength for the lowest heavy hole exciton
  • Keywords
    III-V semiconductors; absorption coefficients; aluminium compounds; electric field effects; electro-optical effects; excitons; gallium arsenide; indium compounds; oscillator strengths; refractive index; semiconductor quantum wells; InGaAs-InAlAs; InGaAs-InAlAs asymmetric coupled quantum wells; abrupt electric-field-induced increase; absorption coefficient; chirp parameter; electric-field-induced refractive index changes; figure of merit; longer wavelengths; lowest heavy hole exciton; numerically analyzed; operating voltage; oscillator strength; Absorption; Excitons; Optical devices; Optical interferometry; Optical materials; Optical refraction; Optical variables control; Refractive index; Resonance; Voltage;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/3.341712
  • Filename
    341712