XPS study of sodium in Bridgman-grown CuInSe2+x

Author

Sunyoung Park ; Champness, Clifford H. ; Ishiang Shih

Author_Institution

Dept. of Electr. & Comput. Eng., McGill Univ., Montreal, QC, Canada

fYear

2014

fDate

8-13 June 2014

Firstpage

1674

Lastpage

1678

Abstract

XPS measurements were made on Bridgman-grown crystalline ingots obtained from melts of composition CuInSe_2+x plus [Na] atomic amounts of elementary sodium, where [Na] ranged from 0 to 6 % and x ranged from 0 to 0.2. It was found that the added Na located itself in a surface layer about 0.2 micron thick and none was detected in the interior of the ingot. For material with and without added Na, copper was found to be depleted at the surface below its proportion deep into the bulk. However, this surface lowering was accentuated with increased added Na up to about 1 at. %, which also increased the surface [Se] proportion for bulk p-type material.

Keywords

X-ray photoelectron spectra; copper compounds; crystal growth from melt; crystal structure; indium compounds; ingots; semiconductor growth; ternary semiconductors; Bridgman-grown crystalline ingots; CuInSe_2+x; XPS; atomic elementary sodium amounts; bulk p-type material; melt composition; surface lowering; surface proportion; Atomic measurements; Compounds; Copper; Materials; Photovoltaic cells; Surface treatment; X-ray scattering; Bridgman growth; XPS; copper indium diselenide; sodium;

fLanguage

English

Publisher

ieee

Conference_Titel

Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th

Conference_Location

Denver, CO

Type

conf

DOI

10.1109/PVSC.2014.6925242

Filename

6925242