DocumentCode
121893
Title
Optimization of electrical performance of Cu(In,Ga)Se2 thin film solar cells sputtered from quaternary targets
Author
Shih, G.H. ; Maximenko, Sergey ; Frantz, J. ; Myers, Joshua ; Bekele, R. ; Mittereder, J. ; Sanghera, J.S. ; Nguyen, V.Q. ; Scheiman, David ; Hoheisel, Raymond ; Walters, Robert
Author_Institution
Crane Div., Naval Surface Warfare Center, Crane, IN, USA
fYear
2014
fDate
8-13 June 2014
Firstpage
1704
Lastpage
1706
Abstract
Utilizing a quaternary target to sputter Cu(In,Ga)Se2 (CIGS) yields films which are dense, polycrystalline and highly oriented. Devices fabricated from these films exhibited efficiencies >10%. In this paper, we study the electrical characteristics of these devices, including current-voltage (I-V), external quantum efficiency (EQE) and sheet and contact resistances measured by the transfer length method, to improve their overall performance. The effect of edge termination by different techniques is reviewed to investigate perimeter effects and edge defects. It was found in these particular devices that mechanical scribing of device areas contributed to both edge and bulk shunt effects. We discuss the extent of these effects in the context of increasing device efficiency through the optimization of edge termination.
Keywords
copper compounds; gallium compounds; indium compounds; semiconductor thin films; solar cells; sputter deposition; thin film devices; Cu(InGa)Se2; EQE; bulk shunt effects; contact resistances; current-voltage characteristics; device efficiency; edge defects; edge termination effect; electrical characteristics; electrical performance optimization; external quantum efficiency; mechanical scribing; perimeter effects; polycrystalline; quaternary targets; sheet resistances; thin film solar cells; Abstracts; Europe; Glass; Magnetic films; Nickel; Solar heating; Spontaneous emission; edge termination; photovoltaic cells; solar energy; sputtering; thin film devices;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
Conference_Location
Denver, CO
Type
conf
DOI
10.1109/PVSC.2014.6925249
Filename
6925249
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