DocumentCode :
121898
Title :
Anomalous dark current ideality factor (n > 2) in thin-film solar cells: The role of grain-boundary defects
Author :
Sozzi, G. ; Mosca, R. ; Calicchio, M. ; Menozzi, R.
Author_Institution :
Dept. of Inf. Eng., Univ. of Parma, Parma, Italy
fYear :
2014
fDate :
8-13 June 2014
Firstpage :
1718
Lastpage :
1721
Abstract :
By comparing simulated and measured dark I-V characteristics of CIGS cells, we investigate the low-voltage anomalous (> 2) ideality factor, and find that it can be explained by large donor trap concentrations at grain boundaries, and SRH recombination therein, with no need of complex models involving tunneling, coupled traps, etc. We studied 3 different samples, in all cases achieving excellent fit of the non-monotonic ideality factor. The illuminated cell performance also matches the experiments very well. The most important parameter determining value and voltage dependence of the anomalous ideality factor is the peak energy of the grain boundary donor distribution.
Keywords :
grain boundaries; semiconductor thin films; solar cells; CIGS cells; SRH recombination; anomalous dark current ideality factor; coupled traps; donor trap concentrations; grain boundaries; grain boundary donor distribution; grain-boundary defects; nonmonotonic ideality factor; peak energy; thin-film solar cells; tunneling; Anodes; Charge carrier processes; Current density; Photovoltaic cells; Physics; Voltage measurement; CIGS; ideality factor; thin-film photovoltaics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
Conference_Location :
Denver, CO
Type :
conf
DOI :
10.1109/PVSC.2014.6925252
Filename :
6925252
Link To Document :
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