DocumentCode :
1219217
Title :
Record fT and fT+fMAX performance of InP/InGaAs single heterojunction bipolar transistors
Author :
Hafez, W. ; Lai, J.W. ; Feng, M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois, Champaign-Urbana, IL, USA
Volume :
39
Issue :
10
fYear :
2003
fDate :
5/15/2003 12:00:00 AM
Firstpage :
811
Lastpage :
813
Abstract :
Record performance is reported for InP/InGaAs single heterojunction transistors. An fT of 382 GHz is reported on a 0.5×12 μm device, the highest for any bipolar device on any material system. Record fT+fMAX of 673 GHz was achieved on a 0.35×8 μm device.
Keywords :
III-V semiconductors; current density; gallium arsenide; heterojunction bipolar transistors; indium compounds; millimetre wave bipolar transistors; 0.35 micron; 0.5 micron; 12 micron; 382 GHz; 673 GHz; 8 micron; InP-InGaAs; InP/InGaAs HBTs; SHBT; current density; high-speed applications; laterally scaled submicron process; low-power circuit applications; output breakdown voltage; single heterojunction bipolar transistors; turn-on voltages; ultra-high-speed ADCs; vertically scaled submicron process;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:20030534
Filename :
1204801
Link To Document :
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