• DocumentCode
    121934
  • Title

    Increased radiation hardness in ultra-thin GaAs single-junction solar cells

  • Author

    Becker, Jurgen ; Ying-Shen Kuo ; Yong-Hang Zhang

  • Author_Institution
    Center for Photonics Innovation & Sch. of Electr., Arizona State Univ., Tempe, AZ, USA
  • fYear
    2014
  • fDate
    8-13 June 2014
  • Firstpage
    1839
  • Lastpage
    1841
  • Abstract
    The absorber-thickness dependent, relative efficiency losses for solar cells with a 300 nm, 1000 nm and 2000 nm thick absorber were found to be 20.5%, 26.8% and 28.6%, respectively, after exposure to 1 MeV electron radiation. Thinner solar cells exhibited smaller efficiency losses than thicker devices; a trend that correlates well with the theoretical prediction using a semi-analytical model.
  • Keywords
    III-V semiconductors; electron radiation; gallium arsenide; solar absorber-convertors; solar cells; GaAs; absorber-thickness; electron radiation; electron volt energy 1 MeV; radiation hardness; semianalytical model; size 1000 nm; size 2000 nm; size 300 nm; ultra-thin single-junction solar cells; Charge carrier lifetime; Degradation; Gallium arsenide; Photovoltaic cells; Radiation effects; Radiative recombination; GaAs; Radiation Hardness; Solar Cell; Space Applications; Thin-Film;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
  • Conference_Location
    Denver, CO
  • Type

    conf

  • DOI
    10.1109/PVSC.2014.6925281
  • Filename
    6925281