PID results at low irradiances on c-Si modules

In order to determine the profitability of a PV project, power plant operators need to predict accurately the final energy production. It is crucial to know the operating power of PV modules. The correlation between the indoor measured power and the operating power is therefore a major issue for several services, such as project design, operation and maintenance. In order to install aging resistant modules, module tests should be selective and representative. In this paper, we implemented an indoor test methodology to accelerate PID degradation dependant on stress (T, RH, V) and mounting systems. The ultimate goal is to define a test protocol which could be representative, selective and reproducible. It could be used as recommendation to IEC 62804 draft. From our study, we concluded that low light behavior should be a mandatory criterion for pass/fail results. STC measurements are not sufficient for measuring PID consequences.