• DocumentCode
    121972
  • Title

    A modeling of soldering adhesion forecast for the crystalline silicon solar cell

  • Author

    Wen-Tai Chung ; Wei-Cyun Lee ; Chi-Kun Wu ; Yu-Ting Hung ; Chien-Wen Chen

  • Author_Institution
    Motech Ind., Inc., Tainan, Taiwan
  • fYear
    2014
  • fDate
    8-13 June 2014
  • Firstpage
    2004
  • Lastpage
    2006
  • Abstract
    The soldering process is an important research subject for photovoltaic application. The soldering adhesion is a critical factor to module reliabilities. In this study, it discloses a non-destroyed method for soldering adhesion forecast of crystalline silicon solar cells. Combine the soldering adhesion test, the bus bar surface roughness measures and a numerical method to develop a numerical model. It could quickly calculate the soldering adhesion, analysis the screen-printing performance and judge the root cause of the soldering failure. The adhesion simulation result is in agreement with the experiment. The error is less 3% between the simulation and the experiment.
  • Keywords
    adhesion; elemental semiconductors; nondestructive testing; numerical analysis; silicon; solar cells; soldering; surface roughness; Si; bus bar surface roughness measures; crystalline silicon solar cell; nondestroyed method; numerical method; photovoltaic application; screen-printing performance; soldering adhesion forecast modelling; soldering adhesion test; soldering failure; Adhesives; Microscopy; Numerical models; Optical imaging; Optical microscopy; Reliability; Semiconductor device modeling; Adhesion; Bus bar; Ribbon; Silicon; Solar cell;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
  • Conference_Location
    Denver, CO
  • Type

    conf

  • DOI
    10.1109/PVSC.2014.6925319
  • Filename
    6925319