Title :
A modeling of soldering adhesion forecast for the crystalline silicon solar cell
Author :
Wen-Tai Chung ; Wei-Cyun Lee ; Chi-Kun Wu ; Yu-Ting Hung ; Chien-Wen Chen
Author_Institution :
Motech Ind., Inc., Tainan, Taiwan
Abstract :
The soldering process is an important research subject for photovoltaic application. The soldering adhesion is a critical factor to module reliabilities. In this study, it discloses a non-destroyed method for soldering adhesion forecast of crystalline silicon solar cells. Combine the soldering adhesion test, the bus bar surface roughness measures and a numerical method to develop a numerical model. It could quickly calculate the soldering adhesion, analysis the screen-printing performance and judge the root cause of the soldering failure. The adhesion simulation result is in agreement with the experiment. The error is less 3% between the simulation and the experiment.
Keywords :
adhesion; elemental semiconductors; nondestructive testing; numerical analysis; silicon; solar cells; soldering; surface roughness; Si; bus bar surface roughness measures; crystalline silicon solar cell; nondestroyed method; numerical method; photovoltaic application; screen-printing performance; soldering adhesion forecast modelling; soldering adhesion test; soldering failure; Adhesives; Microscopy; Numerical models; Optical imaging; Optical microscopy; Reliability; Semiconductor device modeling; Adhesion; Bus bar; Ribbon; Silicon; Solar cell;
Conference_Titel :
Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
Conference_Location :
Denver, CO
DOI :
10.1109/PVSC.2014.6925319