DocumentCode :
121973
Title :
Device for comprehensive analysis of leakage current paths in photovoltaic module packaging materials
Author :
Dhere, Neelkanth G. ; Shiradkar, Narendra S. ; Schneller, Eric
Author_Institution :
Florida Solar Energy Center, Univ. of Central Florida, Cocoa, FL, USA
fYear :
2014
fDate :
8-13 June 2014
Firstpage :
2007
Lastpage :
2010
Abstract :
Photovoltaic (PV) modules in high voltage systems are prone to power loss over time due to leakage current flowing through the module packaging materials. A device has been developed to measure impedances of individual paths of leakage current. This has made it possible to understand the contributions of materials and interfaces responsible for degradation. This was not possible earlier when only total leakage currents were being measured. Detailed analysis of the leakage current paths in the PV modules under high voltage bias is carried out over an extended period. Knowledge about dominant leakage current paths can be used to quantify the physical and chemical changes occurring within the module packaging materials.
Keywords :
electric current measurement; electric impedance measurement; leakage currents; modules; packaging; photovoltaic power systems; PV module; high voltage system; impedance measurement; leakage current measurement; leakage current path analysis; photovoltaic module; photovoltaic module packaging material; power loss; Current measurement; Laminates; Leakage currents; Packaging; Photovoltaic systems; PV Module; Potential Induced Degradation; Reliability; System Voltage Stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
Conference_Location :
Denver, CO
Type :
conf
DOI :
10.1109/PVSC.2014.6925320
Filename :
6925320
Link To Document :
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