• DocumentCode
    1219753
  • Title

    Sparse kernel regression modeling using combined locally regularized orthogonal least squares and D-optimality experimental design

  • Author

    Chen, S. ; Hong, X. ; Harris, C.J.

  • Author_Institution
    Dept. of Electron. & Comput. Sci., Univ. of Southampton, UK
  • Volume
    48
  • Issue
    6
  • fYear
    2003
  • fDate
    6/1/2003 12:00:00 AM
  • Firstpage
    1029
  • Lastpage
    1036
  • Abstract
    The note proposes an efficient nonlinear identification algorithm by combining a locally regularized orthogonal least squares (LROLS) model selection with a D-optimality experimental design. The proposed algorithm aims to achieve maximized model robustness and sparsity via two effective and complementary approaches. The LROLS method alone is capable of producing a very parsimonious model with excellent generalization performance. The D-optimality design criterion further enhances the model efficiency and robustness. An added advantage is that the user only needs to specify a weighting for the D-optimality cost in the combined model selecting criterion and the entire model construction procedure becomes automatic. The value of this weighting does not influence the model selection procedure critically and it can be chosen with ease from a wide range of values.
  • Keywords
    design of experiments; identification; least squares approximations; optimisation; D-optimality experimental design; LROLS model selection; combined locally regularized orthogonal least squares; efficient nonlinear identification algorithm; generalization performance; maximized model robustness; maximized model sparsity; model efficiency; model robustness; sparse kernel regression modeling; Bayesian methods; Covariance matrix; Design for experiments; Design optimization; Eigenvalues and eigenfunctions; Iterative algorithms; Kernel; Learning systems; Least squares methods; Robustness;
  • fLanguage
    English
  • Journal_Title
    Automatic Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9286
  • Type

    jour

  • DOI
    10.1109/TAC.2003.812790
  • Filename
    1205199