Title :
Fault diagnosis of RAMs from random testing experiments
Author :
David, René ; Fuentes, Antoine
Author_Institution :
Lab. d´´Autom. de Grenoble, Inst. Nat. Polytech. de Grenoble, Saint-Martin-d´´Heres, France
fDate :
2/1/1990 12:00:00 AM
Abstract :
It is shown how random testing experiments can be used for fault diagnosis. Starting from a prescribed set of faults, the result of the first experiment allows the authors (1) to determine a subset of faults which are compatible with this result and (2) to choose the second experiment, and so on. An algorithm (each step of which is an experiment) is given, and simulation results are presented
Keywords :
fault location; random-access storage; RAM; fault diagnosis; random testing experiments; simulation results; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Fault diagnosis; Helium; Manufacturing; Production; Read-write memory;
Journal_Title :
Computers, IEEE Transactions on
