DocumentCode :
1219896
Title :
Comments on "Signature analysis for multiple output circuits" by R. David
Author :
David, René
Author_Institution :
Lab. d´´Autom. de Grenoble, Inst. Nat. Polytech., Saint-Martin-d´´Heres, France
Volume :
39
Issue :
2
fYear :
1990
Firstpage :
287
Lastpage :
288
Abstract :
The probability of a fault-free signature has been calculated in the above-named paper (see ibid., vol.C-35, no.9, p.830-7 (1986)) and in an earlier paper by the same author (see ibid., vol.C-29, no.7, p.668-73 (1980)). Implicitly, it was considered as the probability of masking due to signature analysis. It is shown here that this does not correspond exactly to the probability of aliasing. A new definition is given. The difference centers on the event where there are no bit errors in the data to be compressed. When the response of the circuit is correct, the signature is fault-free. However, there is no aliasing.<>
Keywords :
logic testing; fault-free signature; multiple output circuits; signature analysis; Boolean functions; Circuit faults; Circuit testing; Computational modeling; Electrical fault detection; Electrons; Fourier transforms; Harmonic analysis; Logic circuits; Probability;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/12.45217
Filename :
45217
Link To Document :
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