Author :
Ernst, Dan ; Das, Shidhartha ; Lee, Seokwoo ; Blaauw, David ; Austin, Todd ; Mudge, Trevor ; Kim, Nam Sung ; Flautner, Krisztiáan
Keywords :
circuit testing; logic testing; low-power electronics; pipeline processing; power consumption; voltage control; Razor; circuit timing error correction; dynamic voltage scaling; low-power electronics; Circuits; Computer displays; Delay; Dynamic voltage scaling; Error correction; Inverters; Mobile handsets; Temperature; Timing; Voltage control;