Impurities in semiconductive compounds used as HV cable shields

Author

Belhadfa, A. ; Houdayer, A.J. ; Hinrichsen, P.F. ; Kajrys, G. ; St.-Pierre, J. ; Kennedy, G. ; Crine, J.-P. ; Burns, N.

Author_Institution

Lab. of Nucl. Phys., Univ. of Montreal, Que., Canada

Volume

24

Issue

4

fYear

1989

fDate

8/1/1989 12:00:00 AM

Firstpage

709

Lastpage

712

Abstract

Quantitative PIXE (proton-induced X-ray emission) and neutron activation analysis measurements of the concentration and distribution of mineral impurities in three different semiconductive compounds used as HV (high voltage) cable shields have been made. These materials contain varying amounts of different carbon blacks. It is shown that the use of acetylene black significantly reduces the mineral impurity concentrations. From a practical point of view, this should result in better cable quality and thus a longer cable lifetime

Keywords

X-ray chemical analysis; cable sheathing; cable testing; impurity distribution; neutron activation analysis; power cables; HV cable shields; PIXE; acetylene black; cable lifetime; cable quality; carbon blacks; impurity concentration; impurity distribution; mineral impurities; neutron activation analysis; proton-induced X-ray emission; semiconductive compounds; Activation analysis; Cable shielding; Carbon dioxide; Minerals; Neutrons; Organic materials; Power cables; Semiconductor impurities; Semiconductor materials; Voltage;

fLanguage

English

Journal_Title

Electrical Insulation, IEEE Transactions on

Publisher

ieee

ISSN

0018-9367

Type

jour

DOI

10.1109/14.34206

Filename

34206