Implementation of a novel system for measuring the lifetime of OLED panels

This paper presents a reliable and feasible means of evaluating the lifetime of organic light emitting diode (OLED) panels. The proposed system is composed of a PC with a man-machine interface, a power supply with multiple channels and a data acquisition card to record the brightness and voltage drop across the OLED panels. A novel noise filter is also applied to yield a noise-free data acquisition system. The proposed system has the following features. The system can measure the lifetime of one to 256 OLED panels. Second, the system applies a software filter to enhance its immunity to noise. Third, the system supports two different power sources, constant voltage and constant current. The output voltage varies from zero to 25 V and the output current varies from 0.1 mA to 150 mA. Fourth, the system sets off an alarm when the brightness decayed to half of the initial luminance. Fifth, the interval between measurements can be divided into 16 periods at most, so that the user can set the data sampling rate to meet the testing requirements. It also provides a user-friendly environment and multiple-channel power to measure the lifetime of various OLED panels. Therefore, the system could be used in a mass production stage.