DocumentCode
122011
Title
A comparison of accelerated degradation test by a UV pulse laser and fluorescence tubes for EVA films
Author
Li, Y.-T. ; Wang, B.F. ; Lee, Young-Hyun ; Hsieh, C.-F. ; Wu, Hu-sheng ; Huang, D.R.
Author_Institution
Center for Meas. Stand., Ind. Technol. Res. Inst., Hsinchu, Taiwan
fYear
2014
fDate
8-13 June 2014
Firstpage
2188
Lastpage
2190
Abstract
Accelerated degradation test by UV pulse laser and fluorescence tubes for ethylene vinyl acetate (EVA) used as encapsulation of PV-cells is compared. Samples of glass/EVA/glass are prepared and irradiated by a UV pulse laser at 355nm with a repetition rate of 10 Hz, 5 ns pulse width and 10 mJ pulse energy. Spot size is expanded to 1×1 cm2 and thus averaged energy density of 1kW/m2 is available. Induced fast change in yellowness index (ΔYi) is compared between UV pulse laser and conventional fluorescence tubes. Our result shows ΔYi of 10 could be achieved in 20 ~30 hours while exposed EVA to a UV pulse laser. However, ΔYi is still less than 2 for the same sample exposed by fluorescence tubes (60°C, 40 W/m2) in a chamber over 600 hours. Both transmittance and Raman spectrum are also investigated. For samples aged by UV pulse laser, although more decay trend could be observed in transmittance spectrum, rare changes, including fluorescence background are measured by Raman spectroscopy. Our result shows essential difference of polymer degradation in EVA films after accelerated tests by two UV methods.
Keywords
Raman spectra; encapsulation; fluorescence; life testing; polymer films; solar cells; ultraviolet spectra; EVA films; PV-cell encapsulation; Raman spectroscopy; Raman spectrum; UV methods; UV pulse laser; accelerated degradation test; energy 10 mJ; ethylene vinyl acetate films; fluorescence tubes; frequency 10 Hz; polymer degradation; temperature 60 degC; time 5 ns; transmittance spectrum; wavelength 355 nm; yellowness index; Electron tubes; Films; Fluorescence; Glass; Indexes; Measurement by laser beam; Photovoltaic systems; Encapsulation; Qualification and Testing; Reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
Conference_Location
Denver, CO
Type
conf
DOI
10.1109/PVSC.2014.6925358
Filename
6925358
Link To Document