DocumentCode
1220341
Title
Improved Light Output of Nitride-Based Light-Emitting Diodes by Lattice-Matched AlInN Cladding Structure
Author
Cheng, An-Ting ; Su, Yan-Kuin ; Lai, Wei-Chi
Author_Institution
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan
Volume
20
Issue
12
fYear
2008
fDate
6/15/2008 12:00:00 AM
Firstpage
970
Lastpage
972
Abstract
We report the growth of AlInN nearly lattice-matched to GaN using metal-organic vapor phase epitaxy. The full-width at half-maximum of the AlInN peak measured by double crystal X-ray diffraction was 219.8 arcsec for the indium content of 20.8%. The effects of AlInN cladding layers on InGaN-GaN multiple-quantum-well light-emitting diodes (LEDs) were also investigated. From the room-temperature photoluminescence spectra, the shorter emission wavelength and the higher intensity were observed after employing AlInN cladding layers. Compared to the conventional LED, the light output intensity of the LED with AlInN cladding layers was increased due to the enhanced carrier confinement. Besides, we found the light output intensity could be saturated at higher injection current. Although the electrical property of the LED with AlInN cladding layers was slightly degraded, the experimental results in this study could explain the potential applicability of AlInN to the fabrication of cladding layers.
Keywords
III-V semiconductors; X-ray diffraction; aluminium compounds; claddings; gallium compounds; indium compounds; light emitting diodes; photoluminescence; quantum well devices; semiconductor epitaxial layers; semiconductor growth; vapour phase epitaxial growth; wide band gap semiconductors; InGaN-GaN-AlGaN; LED; carrier confinement; cladding structure; double crystal X-ray diffraction; lattice match; light output; light-emitting diodes; metal-organic vapor phase epitaxy; multiple quantum well; photoluminescence; temperature 293 K to 298 K; Carrier confinement; Degradation; Epitaxial growth; Gallium nitride; Indium; Light emitting diodes; Photoluminescence; Quantum well devices; Wavelength measurement; X-ray diffraction; AlInN; lattice mismatch; light-emitting diode (LED);
fLanguage
English
Journal_Title
Photonics Technology Letters, IEEE
Publisher
ieee
ISSN
1041-1135
Type
jour
DOI
10.1109/LPT.2008.922937
Filename
4522586
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