• DocumentCode
    1220341
  • Title

    Improved Light Output of Nitride-Based Light-Emitting Diodes by Lattice-Matched AlInN Cladding Structure

  • Author

    Cheng, An-Ting ; Su, Yan-Kuin ; Lai, Wei-Chi

  • Author_Institution
    Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan
  • Volume
    20
  • Issue
    12
  • fYear
    2008
  • fDate
    6/15/2008 12:00:00 AM
  • Firstpage
    970
  • Lastpage
    972
  • Abstract
    We report the growth of AlInN nearly lattice-matched to GaN using metal-organic vapor phase epitaxy. The full-width at half-maximum of the AlInN peak measured by double crystal X-ray diffraction was 219.8 arcsec for the indium content of 20.8%. The effects of AlInN cladding layers on InGaN-GaN multiple-quantum-well light-emitting diodes (LEDs) were also investigated. From the room-temperature photoluminescence spectra, the shorter emission wavelength and the higher intensity were observed after employing AlInN cladding layers. Compared to the conventional LED, the light output intensity of the LED with AlInN cladding layers was increased due to the enhanced carrier confinement. Besides, we found the light output intensity could be saturated at higher injection current. Although the electrical property of the LED with AlInN cladding layers was slightly degraded, the experimental results in this study could explain the potential applicability of AlInN to the fabrication of cladding layers.
  • Keywords
    III-V semiconductors; X-ray diffraction; aluminium compounds; claddings; gallium compounds; indium compounds; light emitting diodes; photoluminescence; quantum well devices; semiconductor epitaxial layers; semiconductor growth; vapour phase epitaxial growth; wide band gap semiconductors; InGaN-GaN-AlGaN; LED; carrier confinement; cladding structure; double crystal X-ray diffraction; lattice match; light output; light-emitting diodes; metal-organic vapor phase epitaxy; multiple quantum well; photoluminescence; temperature 293 K to 298 K; Carrier confinement; Degradation; Epitaxial growth; Gallium nitride; Indium; Light emitting diodes; Photoluminescence; Quantum well devices; Wavelength measurement; X-ray diffraction; AlInN; lattice mismatch; light-emitting diode (LED);
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/LPT.2008.922937
  • Filename
    4522586