• DocumentCode
    1220787
  • Title

    Sequential failure analysis using counters of Petri net models

  • Author

    Adamyan, Angela ; He, David

  • Author_Institution
    Dept. of Mech. & Ind. Eng., Univ. of Illinois-Chicago, Chicago, IL, USA
  • Volume
    33
  • Issue
    1
  • fYear
    2003
  • Firstpage
    1
  • Lastpage
    11
  • Abstract
    Assessment of reliability and safety of a complex system with sequential failures is an important issue in industries, since the reliability and safety of a complex system depends, not only upon all failed states of the system components, but also upon the sequence of occurrence of those failures. In this paper, we present an alternative methodology for assessing sequential failures in a complex system. In previous research, the probability of sequential failures is computed based on tracking the markings of Petri net models and it is assumed that the time to failure of basic events follows an exponential distribution. To overcome the limitations of the current methods in applying Petri nets for assessment of sequential failures, the method presented in this paper employs the concept of counters used in Petri net simulation to perform sequential failure analysis and is developed based on evolution equations that describe the dynamics of the system. It is demonstrated with a sequential failure analysis example of an automated machining and assembly system.
  • Keywords
    Petri nets; exponential distribution; failure analysis; large-scale systems; reliability theory; safety; Petri net; assembly; complex system; dynamics; exponential distribution; probability; safety; sequential failure analysis; sequential failures; Analytical models; Assembly systems; Counting circuits; Distributed computing; Equations; Exponential distribution; Failure analysis; Machining; Petri nets; Safety;
  • fLanguage
    English
  • Journal_Title
    Systems, Man and Cybernetics, Part A: Systems and Humans, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1083-4427
  • Type

    jour

  • DOI
    10.1109/TSMCA.2003.812595
  • Filename
    1206451