Title :
Design and characterization of an adhesion strength tester for evaluating metal contacts on silicon solar cells
Author :
Young, Trevor L. ; Hee, Kenneth ; Lennon, Alison J. ; Egan, Renate J. ; Wilkie, Oscar ; Yu Yao
Author_Institution :
Suntech R&D Australia Pty Ltd., Sydney, NSW, Australia
Abstract :
Strong contact adhesion is an important requirement for durable, manufacturable solar cells. Advanced contacting technologies require new methods to measure adhesion. We describe a scratch test for measuring contact adhesion that involves scanning a weighted stylus across the cell while measuring the horizontal force FD required to dislodge the contacts. FD is characteristic of the adhesive bond but independent of the contact height, stylus weight and scan speed. We observe that contact peeling depends also on the tensile strength of the metal finger. The tests provide a valuable way to assess and optimize the adhesion of metal contacts.
Keywords :
adhesion; adhesive bonding; elemental semiconductors; mechanical contact; silicon; solar cells; tensile strength; Si; adhesion strength tester; adhesive bond; advanced contacting technologies; contact adhesion; contact peeling; metal contacts adhesion; metal finger; scratch test; silicon solar cells; tensile strength; Adhesives; Fingers; Force; Metals; Photovoltaic cells; Silicon; adhesive strength; metal plating; photovoltaic cell metallization; pull test; scratch tester; silicon; solar cell;
Conference_Titel :
Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
Conference_Location :
Denver, CO
DOI :
10.1109/PVSC.2014.6925450