Title :
Large-scale evaluation of multimodal biometric authentication using state-of-the-art systems
Author :
Snelick, Robert ; Uludag, Umut ; Mink, Alan ; Indovina, Michael ; Jain, Anil
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fDate :
3/1/2005 12:00:00 AM
Abstract :
We examine the performance of multimodal biometric authentication systems using state-of-the-art commercial off-the-shelf (COTS) fingerprint and face biometric systems on a population approaching 1,000 individuals. The majority of prior studies of multimodal biometrics have been limited to relatively low accuracy non-COTS systems and populations of a few hundred users. Our work is the first to demonstrate that multimodal fingerprint and face biometric systems can achieve significant accuracy gains over either biometric alone, even when using highly accurate COTS systems on a relatively large-scale population. In addition to examining well-known multimodal methods, we introduce new methods of normalization and fusion that further improve the accuracy.
Keywords :
face recognition; fingerprint identification; commercial off the shelf fingerprint system; face biometric systems; fusion method; large scale evaluation; large scale population; multimodal biometric authentication systems; multimodal fingerprint system; noncommercial off the shelf fingerprint system; normalization method; state of the art systems; Authentication; Biometrics; Estimation error; Feature extraction; Fingerprint recognition; Large-scale systems; Performance gain; Spatial databases; Support vector machines; System performance; Index Terms- Multimodal biometrics; authentication; face.; fingerprint; fusion; matching score; normalization; Algorithms; Artificial Intelligence; Biometry; Computer Simulation; Dermatoglyphics; Face; Humans; Image Enhancement; Image Interpretation, Computer-Assisted; Information Storage and Retrieval; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity; Subtraction Technique;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2005.57