DocumentCode :
122117
Title :
The study of dependency of external quantum efficiency of triple-junction solar cells on measurement condition
Author :
Sugai, Mitsunobu ; Harada, Jiro ; Imaizumi, Masayuki ; Nakamura, T. ; Ohshima, T.
Author_Institution :
Adv. Eng. Services Co., Ltd. (AES), Tsukuba, Japan
fYear :
2014
fDate :
8-13 June 2014
Firstpage :
2605
Lastpage :
2610
Abstract :
We investigated the measurement technique for the external quantum efficiency (EQE) in triple-junction solar cell. We focused the bias voltage dependence of the EQE signal and the intensity of the incident light to the upper layer. The voltage dependence exhibited several patterns with the quantity of the leak current of the Ge-bottom cell. On the irradiated cells by the low energy proton, the bottom EQE was affected since the quantity of the photocurrent. In addition we tried to introduce the LED bias light method to estimate the effect of the photoluminescence.
Keywords :
elemental semiconductors; germanium; light emitting diodes; photoluminescence; solar cells; EQE signal; Ge; Ge-bottom cell; LED bias light method; bias voltage dependence; external quantum efficiency; incident light; irradiated cells; leak current; low energy proton; measurement condition; photocurrent; photoluminescence; triple-junction solar cells; upper layer; Current measurement; Gallium arsenide; Light emitting diodes; Photoconductivity; Protons; Radiation effects; Voltage measurement; External quantum efficiency; LED bias light; Leak current; Triple-junction solar cell; artifact EQE;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
Conference_Location :
Denver, CO
Type :
conf
DOI :
10.1109/PVSC.2014.6925464
Filename :
6925464
Link To Document :
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