DocumentCode :
1221246
Title :
Common-emitter current gain of AlxGa1-xAs/GaAs/GaAs heterojunction bipolar transistors operating at small collector current
Author :
Liou, J.J.
Author_Institution :
Dept. of Electr. Eng., Univ. of Central Florida, Orlando, FL, USA
Volume :
36
Issue :
9
fYear :
1989
fDate :
9/1/1989 12:00:00 AM
Firstpage :
1850
Lastpage :
1852
Abstract :
A recently developed current gain model, which accounts for high-current effects and can adequately characterize the current gain at high collector current, is improved by including both interfacial and bulk space-charge-region recombination currents, resulting in a comprehensive model that predicts the current gain more accurately at small collector currents. Comparison of the model and measured data for an Al0.25Ga0.75/GaAs/GaAs heterojunction bipolar transistor is included in support of the model
Keywords :
III-V semiconductors; aluminium compounds; electron-hole recombination; gallium arsenide; heterojunction bipolar transistors; semiconductor device models; AlxGa1-xAs-GaAs; HBT; III-V semiconductors; bulk space-charge-region; common-emitter current gain; current gain model; heterojunction bipolar transistors; high-current effects; interfacial space-charge region; recombination currents; small collector current; Bipolar transistors; Charge carrier processes; Current density; Electron emission; Gallium arsenide; Heterojunction bipolar transistors; Predictive models; Semiconductor process modeling; Tunneling; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.34254
Filename :
34254
Link To Document :
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