Compact accelerated life testing with expanded measurement suite

An accelerated-life-testing (ALT) system has been built at the Colorado State University Photovoltaics Laboratory with an emphasis on versatility and periodically performing a suite of electronic measurements on stressed devices. The setup utilizes a scientific oven with a footprint of 17 × 17 inches as a stress chamber and four commercially available 40 W broad-spectrum LED arrays. A preliminary study has been performed on Cadmium Telluride (CdTe) devices. Devices were held at elevated temperature and were exposed to nominally one-sun illumination. Measurements taken of stressed devices include J-V, QE, C-V, electroluminescence (EL) and light-beam-induced current (LBIC).