Title :
Recovery of Dielectric Strength after Current Interruption in Vacuum
Author_Institution :
General Electric Company Research and Development Center P.O. Box 8 Schenectady, New York 12301
Keywords :
Breakdown voltage; Circuit faults; Delay effects; Dielectric breakdown; Electrodes; Power supplies; Power system relaying; Research and development; Switches; Vacuum arcs;
Journal_Title :
Plasma Science, IEEE Transactions on
DOI :
10.1109/TPS.1978.4317143
