Title :
Dielectrics for bright EL displays
Author :
Tiku, Shiban K. ; Rustomji, Sam H.
Author_Institution :
Sigmatron Nova Inc., Thousand Oaks, CA, USA
fDate :
9/1/1989 12:00:00 AM
Abstract :
Electroluminescent (EL) display design for high brightness is discussed. Single-layer and stacked dielectrics based on aluminum oxide, tantalum oxide, and silicon oxynitride are compared, and total stack designs are optimized for high brightness and manufacturability. Brightness values of 1 fL/Hz at Vt+30 V have been achieved
Keywords :
brightness; electroluminescent displays; Al2O3; SiON; Ta2O5; bright EL displays; brightness; manufacturability; single-layer dielectrics; stacked dielectrics; total stack designs; Aluminum oxide; Brightness; Dielectrics; Displays; Electrons; Interface states; Manufacturing; Optimized production technology; Phosphors; Sputtering;
Journal_Title :
Electron Devices, IEEE Transactions on