• DocumentCode
    1221517
  • Title

    Comparative TE modal analysis and extended parameter calculations of magnetron-wall waveguide for gyro-peniotron applications

  • Author

    Pate, M.C. ; Grow, Richard W. ; Baird, J.M.

  • Author_Institution
    Dept. of Electr. Eng., Utah Univ., Salt Lake City, UT, USA
  • Volume
    36
  • Issue
    9
  • fYear
    1989
  • fDate
    9/1/1989 12:00:00 AM
  • Firstpage
    1976
  • Lastpage
    1982
  • Abstract
    Accurate determination of the magnetron-wall waveguide modal content is approached by examining the waveguide transverse cutoff constant (for which no closed-form analytic solution is known). The method of solution involves dividing the waveguide into two regions, an inner (circular) region and an outer (slot) region, assuming a constant electric field at the common interface, and equating the impedance functions at the interface. Computer calculations include large ratios of outer-to-inner wall radii (20:1), normalized slot angles between 0.01 and 0.99, a variable number of vanes (2-30), and higher-order modes that have not been previously reported. Mode numbering of the higher-order modes is also considered. The TE mode spectrum is plotted as a function of waveguide geometry. A waveguide model was built, and frequency resonances were measured. Resonances were correlated using a scanning filter computer program and used to calculate the modal cutoff frequencies. Experimental data agree with calculated values to within 1.25, 0.57, 0.49, and 2.48% for the four modes detected thus far. Results for lowest-order modes agree with those of other investigators to within about 5% or better in most instances
  • Keywords
    gyrotrons; magnetrons; waveguide theory; TE modal analysis; computer calculations; extended parameter; frequency resonances; gyro-peniotron; impedance functions; magnetron-wall waveguide; modal cutoff frequencies; mode numbering; scanning filter computer program; slot angles; waveguide geometry; waveguide model; waveguide transverse cutoff constant; Blades; Filters; Frequency measurement; Geometry; Impedance; Magnetic analysis; Modal analysis; Resonance; Resonant frequency; Tellurium;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.34280
  • Filename
    34280