Title :
Copper metallization of silicon PERL solar cells: 21% cell efficiency and module assembly using conductive film
Author :
Kyumin Lee ; Dohyeon Kyeong ; Moonseok Kim ; Won-Jae Lee ; Eun-Chel Cho
Author_Institution :
Hyundai Heavy Ind., Co., Ltd., Yongin, South Korea
Abstract :
We present updated results of our research on the p-type silicon PERL solar cells with plated Ni/Cu/Ag or Ni/Ag contacts, Al2O3 rear passivation, and screen-printed local Al BSF. Large-area cells prepared on 156 mm commercial-grade boron-doped Cz Si wafers show maximum 21.4% conversion efficiency, and maximum 675 mV open-circuit voltage. Modules were successfully assembled by bonding inter-connect ribbon wires on the cells with conductive film. Accelerated reliability tests show that our Ni seed layer is an effective barrier against Cu diffusion. We present our cost-effectiveness calculations for the Cu plating metallization and discuss the requirements for it to penetrate the mainstream market.
Keywords :
bonding processes; copper; elemental semiconductors; life testing; metallisation; reliability; silicon; solar cells; Al2O3; Ni-Cu-Ag; Si; accelerated reliability tests; boron-doped Cz silicon wafers; cell efficiency; cell module assembly; conductive; conductive film; copper diffusion; copper metallization; copper plating metallization; inter-connect ribbon wires bonding; open-circuit voltage; p-type silicon PERL solar cells; rear passivation; screen-printed local aluminium BSF; silicon PERL solar cells; voltage 675 mV; Annealing; Dielectrics; Manufacturing; Metallization; Nickel; Photovoltaic systems; Silicon; copper; metallization; photovoltaic cells; silicon;
Conference_Titel :
Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
Conference_Location :
Denver, CO
DOI :
10.1109/PVSC.2014.6925517