• DocumentCode
    122177
  • Title

    Procedure for applying IEC-61853 test data to a single diode model

  • Author

    Dobos, Aron P. ; MacAlpine, Sara M.

  • Author_Institution
    Nat. Renewable Energy Lab., Golden, CO, USA
  • fYear
    2014
  • fDate
    8-13 June 2014
  • Firstpage
    2846
  • Lastpage
    2849
  • Abstract
    Accurate modeling of a photovoltaic module´s current-voltage characteristic is essential to predicting the generated power at any operating condition. This paper presents an approach to improve prediction accuracy of current single diode models by leveraging test data collected according to the IEC-61853 standard. Modified auxiliary diode model equations are proposed, along with a procedure to automatically calculate the additional model parameters from test data. The extended single diode model indicates potential to reduce average maximum power point prediction error across a wide temperature and irradiance range by about 75 % relative to the baseline five parameter model.
  • Keywords
    IEC standards; photovoltaic cells; photovoltaic power systems; power semiconductor diodes; IEC-61853 test data standard; average maximum power point prediction error reduction; modified auxiliary diode model equations; photovoltaic module current-voltage characteristic; photovoltaic systems; single diode model; Complexity theory; Predictive models; IEC-61853; performance modeling; photovoltaic module model; single diode model; thin film model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
  • Conference_Location
    Denver, CO
  • Type

    conf

  • DOI
    10.1109/PVSC.2014.6925525
  • Filename
    6925525