DocumentCode :
122177
Title :
Procedure for applying IEC-61853 test data to a single diode model
Author :
Dobos, Aron P. ; MacAlpine, Sara M.
Author_Institution :
Nat. Renewable Energy Lab., Golden, CO, USA
fYear :
2014
fDate :
8-13 June 2014
Firstpage :
2846
Lastpage :
2849
Abstract :
Accurate modeling of a photovoltaic module´s current-voltage characteristic is essential to predicting the generated power at any operating condition. This paper presents an approach to improve prediction accuracy of current single diode models by leveraging test data collected according to the IEC-61853 standard. Modified auxiliary diode model equations are proposed, along with a procedure to automatically calculate the additional model parameters from test data. The extended single diode model indicates potential to reduce average maximum power point prediction error across a wide temperature and irradiance range by about 75 % relative to the baseline five parameter model.
Keywords :
IEC standards; photovoltaic cells; photovoltaic power systems; power semiconductor diodes; IEC-61853 test data standard; average maximum power point prediction error reduction; modified auxiliary diode model equations; photovoltaic module current-voltage characteristic; photovoltaic systems; single diode model; Complexity theory; Predictive models; IEC-61853; performance modeling; photovoltaic module model; single diode model; thin film model;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th
Conference_Location :
Denver, CO
Type :
conf
DOI :
10.1109/PVSC.2014.6925525
Filename :
6925525
Link To Document :
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